Abstract
A noncontact experimental method for determining mass‐transfer boundary layer thicknesses in electrochemical systems has been examined. The technique is based on the premise that the relaxation in concentration overpotential after current interruption is an accurate measure of liquid‐phase mass‐transfer resistance. Experimental overpotential decay data were fitted to a theoretical surface concentration decay model. Boundary layer thicknesses were determined by matching the real time scale of the experimental data and the dimensionless time scale of the theoretical analysis. Overpotential relaxation experiments were performed at a vertical flat plate copper cathode with natural convection stirring. The effects of electrode height, current density, and electrolyte composition on mass‐transfer boundary layer thicknesses were examined and correlated. The results agree well with existing Sherwood‐Schmidt‐Grashof number correlations.
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