Abstract
The growth and shape of fungal cells, such as fission yeast, are strongly constrained by the mechanics of their cell wall (CW). The cell wall encases the plasma membrane and defines instantaneous cell shapes by opposing turgor pressure-derived stress on the cell surface. Measuring cell wall mechanical properties may thus bring key insights into the regulation of cell morphogenesis, cell growth, but also cell surface integrity and survival. The fission yeast cell wall has a thickness of a few tens to hundreds of nanometers, and bulk elasticity similar to that of rubber (tens of MPa). These mechanical properties vary locally around single cells, for instance, at the new vs. old growing ends, or birth scars, and may also largely depend on growth conditions and life cycle phases. While cell wall thickness and mechanics have been traditionally measured by complex methodologies including electron microscopy and atomic force microscopy, we here propose a method based on light microscopy to infer with medium-throughput cell wall mechanical properties, as well as turgor pressure in time and space in living cells. This analysis will enhance our appreciation of the mechanical regulation of fission yeast cell morphogenesis and may be directly transferable to the study of other fungal cells.
Published Version
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