Abstract
Nominally binary CdSe quantum wells (QWs) with thicknesses from 1.0 to 2.5 monolayers embedded in ZnSe were grown by molecular beam epitaxy on GaAs(0 0 1) substrates. The investigation of the samples by high-resolution X-ray diffraction (HRXRD) and high-resolution transmission electron microscopy (HRTEM) is focused on the vertical cadmium distribution in the QW region. Both the total Cd content and the real QW thicknesses determined by HRXRD and HRTEM are in good agreement. The findings point to the formation of ternary ZnCdSe wells with thicknesses of 4–6 monolayers nearly independent of the intended QW thickness and applied substrate temperature during growth. This can be ascribed either to a strongly enhanced Cd diffusion in ZnSe or to Cd surface segregation.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
