Abstract
Introduction Recently, several methods have been commonly in use for the quantitative analysis of different samples [1–3]. Some of these are destructive for, e.g., atomic emission and absorption spectroscopy. The techniques, such as activation analysis and X- or γ-ray transmission, are nondestructive and require accurate measurements of the sample thickness and a good experimental arrangement [4,5]. X-ray fluorescence (XRF) and photon induced X-ray emission spectroscopy are restricted to the surface of the analyzed sample [1,6]. Analysis with the XRF technique in cases of overlap may not well resolve characteristic peaks. Therefore, use of scattered intensity ratios is more appropriate for analysis of binary systems.
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