Abstract
The Single Event Functional Interruption (SEFI) effect of the atmospheric neutron radiation in microprocessor parts of automotive electronic systems is analyzed in this study. The white neutron source of CSNS (China Spallation Neutron Source) is used for three automotive electronic Systems to neutron radiation test in the microprocessors in the systems. It shows that the neutron fluence threshold of SEFI varies greatly with the feature size of the device. The 40 nm process device with large feature size do not failure at 5xl09n/cm2neutron fluence, but SEFI phenomenon occurs in both devices of 28nm process. The SEFI section and soft error rate of the 28nm process MPU microprocessors are calculated, and the soft error rate is above 103FIT, far exceeding the soft failure rate requirements of automotive electronic systems. It can be seen that large-scale advanced process integrated circuits in automotive electronic systems are susceptible to atmospheric neutron radiation effects, and it will affect automotive safety issues.
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