Abstract

The article presents an efficient method named wave concept iterative process(WCIP) for characterization of substrate integrated waveguide(SIW) structures in LTCC. Firstly, an extensible approach of the iterative method to study substrates with n layers is researched. The approach involves the mixed magnetic and electric filed equation technique and the multilayer contribution of wave concept iterative process, which involves S-parameters extraction technique based on a simple form of Matched Load Simulation, and then, Substrate integrated circuits are considered as an ensemble of conducting vias placed in a parallel-plate waveguide. Finally, A new kind of multilayer SIW filter in LTCC is analyzed using the iterative method. Numerical results obtained are compared with the HFSS results. A good agreement is achieved together with significant improvements both in computational time and memory requirements.

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