Abstract

We propose a novel p+ (Si1−xGex)-n−-n+hetero-junction power diode with three-step gradual changing dopingconcentration in the base region, and the structure mechanism isanalysed. The fast and soft reverse recovery characteristics have beenobtained and the optimal design of the changing doping concentrationgradient and the percentage of Ge is carried out. Compared to theconventional structure of p+ (Si1−xGex)-n−-n+with a constant doping concentration, the softness factor S increasesnearly two times, the reverse recovery time and the peak reversecurrent are reduced over 15% for the device with the optimizedconcentration gradient, while the forward drop is almost unchanged.Taking into account of the improvement of the whole characteristics ofthe novel device, we obtain the optimal percentage of Ge to be 20%.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.