Analysis and measurement of the stray light of the visible and near-infrared imaging spectrometer

Abstract

In this paper, the generation mechanism of stray light is analyzed for a visible and near infrared imaging spectrometer with a spectral range of 400nm to 900nm. The optical mechanical model of the instrument was established and its stray light level was simulated. Based on the notch method, A stray light measuring device is built. The veiling glare index of the imaging spectrometer is measured to be 0.84%. The uncertainty of measurement is assessed by GUM method, and the influence of uncertainty components on the measurement results is analyzed. When the confidence probability of the measuring device is 95.45%, the measurement uncertainty of veiling glare index is 0.15%. Finally, a comparison and analysis are made between the simulated values of the veiling glare index and the actual measured values. This work provides technical support for the development of high resolution imaging spectrometer.