Abstract
The activation methods, nuclear reactions and chemical separation processes used to determine traces of carbon, nitrogen and oxygen in the metals and semiconductors considered are described briefly. The results obtained are reviewed. They mainly concern the following analyses: (1) determination of carbon and oxygen in alkaline metals; (2) determination of nitrogen and oxygen in refractory metals; (3) determination of carbon, nitrogen and particularly oxygen in various other metals; (4) determination of these same elements in semiconducting materials. In some cases the concentrations measured by γ photon or charged particle activation methods are compared with the results obtained by other techniques.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
