Analyse du contraste d'un sous-joint de torsion (0 0 1) dans le silicium en MET à deux ondes

Abstract

A quantitative analysis of the image of a low angle (0 0 1) twist boundary in silicon is performed using the two-beam dynamical theory of electron diffraction. The contrast features are discussed as functions of the thickness of the foil and possible elastic relaxation effects of the low angle twist boundary in the thin foil. To cite this article: R. Bonnet et al., C. R. Physique 3 (2002) 657–663.