Analog Circuit Fault Diagnosis Using LDA and OAOSVM Approach

Abstract

Fault diagnosis of analog circuits is essential for guaranteeing the reliability and maintainability of electronic systems. Analog circuit fault diagnosis can be regarded as a pattern recognition issue and addressed by Multi-class SVM. A novel diagnosis technique based on linear discriminant analysis and one-against-one SVM is proposed in the paper. In order to obtain a good SVM-based fault classifier, the linear discriminant analysis technique is adopted to capture the major fault features. The extracted fault features are then used as the inputs of one-against-one SVMs to solve fault diagnosis issue. The effectiveness of the proposed approach is demonstrated by the experimental results.