Analog circuit fault diagnosis based on noise measurement

Abstract

In this paper, an analog circuit fault diagnosis method using a noise measurement and analysis approach is suggested. Compared to the conventional circuit fault diagnosis methods, this method can discover hidden and early circuit fault caused by the device defects. Since circuit fault diagnosis is more difficult than device-defect detection, in this paper the circuit output noise calculation, the comparison between the normal and failure conditions and the circuit fault diagnosis method have been discussed. Finally, an example of an active filter circuit fault diagnosis has been given by using this method.