Abstract
Novel SiON glasses obtained by melting mixtures of crystalline α-SiO2 and α-Si3N4 were investigated by means of X-ray photoelectron spectroscopy (XPS). The incorporation of nitrogen into the SiO2 network was recently proved by 29Si-MAS-NMR (magic-angle spinning nuclear magnetic resonance) and Si K-XANES (X-ray absorption near edge structure). The Si 2p XPS and the Si KLL XAES (X-ray excited Auger electron spectroscopy) studies of the SiON glasses confirm the formation of mixed structural units (SiOxN4-x) by the presence of an additional spectral component energetically located between SiO2- and Si3N4-like signals. The N 1s and O 1s XPS spectra support the conclusion about the incorporation of nitrogen into the SiO2 network.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
