Abstract
X‐ray photoelectron spectroscopy (XPS) was applied to the surface chemical characterization of and heterojunctions with emphasis upon the effects of the ambient (oxygen and water vapor in particular) on chemical species present at or near the surface. Elevated temperature during or subsequent to formation of a junction promoted migration of Zn and Cd toward the surface. When formed on , the surface was found to contain (or), , and . Preferential segregation of to the surface was observed in specimens formed on . For substrates, was the predominant species, with the Cu and Cd compounds present in lesser amounts. Also, development of djurleite and diginite phases during heat‐treatments was verified by x‐ray diffraction.
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