An X-ray diffraction study of a chromophoric liquid crystal polysiloxane

Abstract

Abstract Polymeric materials of composition, where a = 0.54, b + c = 0.46 and c = 0.000, 0.029, 0.059, 0.107, 0.234 have been characterized using X-ray diffraction and found to have bilayer S A structures. The smectic layer spacing of 39 A at 20°C was found to decrease by 0.04 A K−1 with increasing temperature for all the materials.