Abstract
Results of X-ray diffraction and X-ray photoelectron spectroscopy investigations on the crystallization behaviour of an amorphous In20Te80 system and the effects of crystallization on the electronic core levels of In and Te atoms are presented. During controlled heat treatments three crystalline phases, Te, α-In2Te3, and In2Te5-I, were observed in this system. In addition, a few splat-cooled samples were found to exhibit a new metastable crystalline phase. Photoelectron measurements revealed that the Te 3d and 4d core levels of amorphous In20Te80 were shifted downwards in energy from their characteristic values of pure Te metal. The In 3d and 4d levels experienced large energy shifts due to alloying, but remained unaffected by heating at temperatures below 520 K.
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