Abstract

AbstractA back-reflection focusing camera has been constructed in which instrumental errors, including those due to uneven film shrinkage, have been eliminated or very much reduced. This has been achieved by employing metrological techniques both in construction and calibration, The temperature of the camera can be controlled to 0.05°C. The form of the specimen is such that horizontal and vertical divergence cause no line shift. The X-ray source is a demountable semimicrofocus tube with an adjustable focus. The radiation is monochromatized by a bent and ground quartz crystal.

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