Abstract
An interface wave can be excited at the surface between two solids containing a thin solid film. The exact and approximate solutions for the velocity of interface waves are compared. The model is then extended to the case of weak adhesion between the film and the substrates. The concept of the effective shear modulus is introduced. This modulus depends both on the shear modulus of the film and on the quality of the bonds between the film and the substrates. A method of measuring the effective modulus and of estimating the adhesive quality on the basis of these measurements is considered.
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