Abstract
We present the development of a novel UHV compact reflectometer designed and developed for the investigation of magnetic properties of thin films at the ID12‐E.S.R.F. beamline. This new instrument is dedicated to x‐ray resonant magnetic reflectivity experiment from thin film or multilayered sample. We present the principles of this versatile and simple instrument. We report also the results of resonant magnetic reflectivity experiments carried out for the Fe/Ir multilayers. This will demonstrate the capability to record either angle or energy dependent measurements at the L edges of Ir simultaneously to the XMCD spectra.
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