Abstract
Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.
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