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Abstract
The problem of pattern recognition is introduced and its major approaches briefly reviewed. In the decision‐theoretic approach, both parametric and nonparametric classification techniques are described. In the syntactic approach, pattern description languages and their recognition algorithms are discussed. Application examples are presented. VLSI implementations of some of the techniques are discussed. A unified syntactic‐semantic approach is then proposed. Problems for further study are suggested. [Work supported by NSF under Grant ECS 81‐19886.]
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