Abstract

On-chip multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sample time generation with a 10-bit variable step delay generator and digitization with a 10-bit incremental reference voltage generator. The prototype in a 0.18-/spl mu/m CMOS technology demonstrated on-chip waveform acquisition at 40-ps and 200-/spl mu/V resolutions. The waveforms were as accurate as those acquired by an off-chip measurement technique, while 95% reduction of measurement time was achieved.

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