Abstract
The use of an electrostatic ion-optic method for the preparation of very thin radioactive sources at high yield is described. The merits of the procedure are demonstrated for a thin 228Th source by two different methods: (1) the measurement of the fwhm of the alpha-peak; (2) the determination of the median range of the 224Ra alpha-decay recoils in hydrogen gas. For a 0.15 μCi source of 228Th, a resolution (fwhm) of better than 13 keV was obtained in the alpha-peak using a Si-solid state detector.
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