Abstract
Iron pyrite (FeS2) thin films were obtained by sulfurization of hematite (Fe2O3) thin films at different sulfurization temperatures (TS) and sulfurization time (tS). Phase purity of sulfurized films was investigated with X-ray diffraction, Raman Spectroscopy and Vibrating sample magnetometry (VSM). Sulfurization temperature and time were found to have a complementary effect on the phase purity of pyrite films. Secondary phase formation in the pyrite films decreased with increasing sulfurization temperature or time. Pyrite films confirmed to be phase pure with XRD and Raman spectroscopy showed the presence of other phase(s) when analyzed with VSM. Merely XRD measurements were not sufficient to claim the phase purity of pyrite films.
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