Abstract

In this paper, Zn1−xMgxS thin films were co-sputtered on glass substrates using ZnS and MgS binary target materials under various applied RF power. The compositional ratio of Zn1−xMgxS films was varied by changing the RF power at an elevated temperature of 200 °C. The structural and optical properties were studied in detail. The structural analysis shows that the co-sputtered Zn1−xMgxS thin films have a cubic phase with preferred orientation along the (111) plane. The lattice constant and ionicity suggest the presence of a zincblende structure in Zn1−xMgxS thin films. Zn1−xMgxS thin films have transmittance over 76%. The extrapolation of optical characteristics indicates that direct bandgaps, ranging from 4.39 to 3.25 eV, have been achieved for the grown Zn1−xMgxS films, which are desirable for buffer or window layers of thin film photovoltaics.

Highlights

  • ZnS and MgS-based devices have shown promising results in optoelectronic applications

  • In fabricating semiconductor devices such as thin film solar cells, there is a need for an n-type buffer layer material to form a metallurgical and electrical junction with the p-type absorber layer

  • Wide bandgap II-VI compounds are promising for short wavelength optoelectronic applications, i.e., from the green to the ultraviolet spectral region [13]

Read more

Summary

Introduction

ZnS and MgS-based devices have shown promising results in optoelectronic applications. Further modifications of these materials can make their range of properties broader in the respective applications. II-VI compounds, such as CdS [1,2,3,4], ZnS [5,6,7], CdZnS [8,9,10,11,12], etc., are commonly used as buffer layers The bandgap of these films varies from 2.45 to 3.25 eV. It can be summarized that bandgap engineering is engineering is possible by controlling the synthesis processes of II–VI group ternary alloy. Possible by controlling the synthesis processes of II–VI group ternary alloy ZnMgS. ZnMgS discussed in detail, basedbased on the on findings from the experiments conducted throughout throughout this study. this study

Deposition
Schematic sputtering system system used used in in ZnMgS
Characterization of Thin Films
Results and Discussion
Compositional
Structural Properties
Optical Properties
Conclusions
Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call