An interface crack between an orthotropic thin film and substrate

Abstract

This work is concerned with a semi-infinite interface crack between a thin film and a substrate. The two materials are assumed to be linearly elastic and orthotropic. A solution is presented for the stress field due to an edge dislocation on the interface which is valid for any combinations of material parameters. It is found that the behavior of such a bi-material system is governed by 6 independent material parameters. The stress intensity factor is computed for general edge loadings by solving integral equations numerically, and the size of the K-dominant zone is also studied for a residually stressed thin film. The situations in which the K-field zone of dominance is very small are identified and discussed.