Abstract
AbstractTwo potential functions, V2(R) and Veff(R) are derived for Cu from phonon dispersion curves. V2(R) is fitted to the phonon frequencies without considering possible multi‐ion effects, whereas Veff (R) is constructed by including dominant multi‐ion interactions in the potential. V2(R) is in relatively close agreement with more fundamental potentials at short distances, whereas Veff(R) appears to give a somewhat better representation of the long‐range interactions. Both of these potentials are used in a calculation of the energies of intrinsic and extrinsic stacking faults. This calculation gives reasonable results, 30 mJ/m2 for γintr and 35 mJ/m2 for γextr.
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