Abstract
The authors present ITPG (Interactive Test Pattern Generator), an automatic test pattern generation tool which produces high fault coverage for complex sequential circuits. The tool is more successful than previous attempts at sequential test generation because of the innovative heuristics and high-level sequential primitives used in the system. Old heuristics, such as controllability and observability, have been extended to the sequential world, and a new heuristic, grouping, has been added to accelerate sequential test pattern generation. In addition, the tool allows the designer to influence the test generation process, thus resulting in the 'interactive' nature of the tool. Results from real industrial VLSI circuits show the effectiveness of this tool. >
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
