Abstract
Intensity-monitoring techniques make possible the measurement of rapid changes in the ellipsometric parameters. Methods used hitherto have been suitable for measuring slight changes only and require prior knowledge of the Δ and Ψ values for the initial surface. It is shown that larger changes can also be measured and that the values of Δ and Ψ for the initial surface need not be known beforehand. To illustrate the method measurements are made relating to the anodising of a hanging mercury drop electrode in 1 mol dm −3 NaOH; under these conditions a thick oxide layer is known to be formed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
