Abstract
A versatile and sensitive instrument has been developed that is capable of measuring the percentage change in resistance for giant magnetoresistance (GMR) thin films as a function of applied magnetic field, drive current or time. The system is designed to have high resolution and minimum noise through optimised design and choice of components. The resistance changes in a thin film are detected indirectly by the system using a four-point in-line probe or by direct measurement of patterned samples.
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