Abstract
We report a demonstration of a surface ion trap fabricated directly on a highly reflective mirror surface, which includes a secondary set of radio frequency (RF) electrodes allowing for translation of the quadrupole RF null location. We introduce a position-dependent photon scattering rate for a 174Yb+ ion in the direction perpendicular to the trap surface using a standing wave of retroreflected light off the mirror surface directly below the trap. Using this setup, we demonstrate the capability of fine-tuning the RF trap location with nanometer scale precision and characterize the charging effects of the dielectric mirror surface upon exposure to ultra-violet light.
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