Abstract
An integrated logic (I/SUP 2/L) macromodel for computer simulation of logical configurations of I/SUP 2/L gates is presented. The macromodel is synthesized from the familiar Ebers-Moll equivalent circuit which permits compatibility with numerous presently available circuit simulators. Measurement procedures are described for the complete and self-consistent set of electrical parameters required for macromodel definition. A five-stage ring oscillator is computer simulated to demonstrate the application of the macromodel. Lateral current transfer (LCT) between adjacent gates and injector current redistribution (ICR) effects are shown to reduce gate propagation delay times. When both effects are included, the macromodel produces an agreement between computer simulated and experimental results of better than 10 percent. A ring oscillator example illustrates the use of the macromodel to provide physical insight into the layout sensitivity of I/SUP 2/L.
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