Abstract
In infrared imaging techniques, overcoming the interference of complex background reflections is a challenge for obtaining sub-surface information of samples. The polarization indirect parameter imaging (PIMI) method can characterize the polarization property of samples by modulating the polarization states of the illumination light and highlight the anisotropic details of the sample through parametric images. In this paper, a far-infrared PIMI imaging system and the inversion model of the properties of the sample were established. A composite structure plate made of carbon fiber plate and aluminum alloy with internal defects was measured. The experimental results demonstrated that the polarization parameter images can sense the structures of the sample beneath the surface and improve the contrast between the target area and the background area, which implies that the system has the potential for non-destructive evaluation applications.
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