An infrared detector with integrated signal processing

Abstract

A new type of infrared detector is described which is known by the acronym Sprite (Signal Processing In The Element). In its most basic form, the device is a three lead structure in n-type cadmium-mercury-telluride which performs the same function in a serial or serial-parallel scan thermal imaging system as a row of conventional detectors together with their associated preamplifiers and time-delay-integration circuits. This very simple structure has resulted in a considerable reduction in the complexity of current thermal imaging systems and offers a straightforward route to future performance improvements. It operates in the 8-14 µm waveband at 80K or in the 3-5 µm band at temperatures readily achievable with thermoelectric coolers.