Abstract
A data-base management system has been applied to the management of test results in the development of an integrated-circuit (IC) memory device. The system software is largely independent of the specific device tested and can be applied to any IC device that can be characterized by chips within slices within lots. Several sets of parametric and go-nogo test sequences can be maintained simultaneously. Changes in the tests can be made with no change in the reporting software or the data-base structure. Only one program need be changed when an entry system format is changed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
