Abstract
AbstractThis paper deals with step‐stress accelerated life testing. It presents a practical method to analyse temperature step‐stress accelerated life test data. The Arrhenius model is considered. Activation energy and failure rate under operational conditions are estimated both graphically and using maximum likelihood. Applications on simulated data and on real data are presented. Copyright © 2001 John Wiley & Sons, Ltd.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
