An Improved YOLOv5x-Based Algorithm for IC Pin Welding Defects Detection

Abstract

This study suggests an integrated circuit (IC) pin welding defect detection algorithm based on improved YOLOv5x to address the issues of low detection accuracy caused by small target size and dense pin arrangement in IC pin welding defects identification. The ability of the network to extract features is improved by effective fusing of features with various receptive fields through the inclusion of the D-SPP module to merge different channel information. The introduction of the mask self-attention mechanism module increases the network’s capacity to recognize global feature correlations and raises the algorithm’s detection precision. In order to speed up the model’s convergence and tackle the issue of sample imbalance in BBox regression, the Focal-EIoU loss function is applied. The detection accuracy and speed are increased by using the k-means++ clustering algorithm to create nine clustering centers to figure out the size of the prior box. According to the results of the experiment, the new method achieves average precisions for short-circuit, missing pin, pin-cocked, and little tin faults in IC pin welding of 96.7%, 94.5%, 95.6%, and 93.3%, respectively. The mean average precision increases to 95.0% at a threshold of 0.5, which is 13.3% and 8.9% greater than YOLOv3 and YOLOv5x, respectively. A reference value for IC pin welding defect identification is provided by the improved algorithm, which has a detection time of 0.142 seconds per image. This meets the speed requirements of IC quality inspection.