Abstract
A modified single-line technique for determining separately the size and lattice distortion parameters of the crystalline regions by wide-angle X-ray scattering (WAXS) of typical polymer materials is proposed. The efficiency of the method is demonstrated by model calculations. Furthermore, the improved single-line treatment is applied to experimentally gained WAXS profiles of polyethylene, for which, for comparison, a standard two-line profile analysis was also applied. Two alternative single-line methods presented in the literature for the investigation of metal WAXS profiles are taken into consideration.
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