An improved procedure for fringe-locked photorefractive running hologram data processing

Abstract

We report a new improved procedure for experimental data fitting in photorefractive fringe-locked running hologram experiments. From this fitting we compute the diffusion length LD, the Debye screening length ls, and the quantum efficiency for photo-excitation of charge carriers ?, with a lower degree of uncertainty than reported in previous publications. The procedure was successfully tried on an undoped B12TiO20 (BTO) crystal and led to LD = 0.16??m, ls = 0.038??m, and ? = 0.33, in good agreement with the already available information on this sample. The effectively applied electric field coefficient in the experiment was also estimated.