Abstract
The dielectric breakdown of solid polymeric materials is due to the inception and propagation of electrical trees inside them. The remaining useful life of the solid dielectrics could be determined using propagation simulations correlated with non-intrusive measurements such as partial discharges (PD). This paper presents a brief review of the different models for simulating electrical tree propagation in solid dielectrics. A novel improved physical-stochastic model is proposed, which allows quantitatively and qualitatively analyzing the electrical tree propagation process in polymeric dielectrics. Simulation results exhibit good agreement with measurements presented in the literature. It is concluded that the model allows adequately predicting the tree propagation behavior and additional experimental analyses are required in order to improve the model accuracy.
Highlights
Insulation systems are designed in such a way that the electric fields applied to the materials are lower than the inception values for breakdown mechanisms
Due to unforeseen manufacturing problems or operating conditions, metal contaminants, mechanical defects, conducting projections or air-filled cavities may appear, causing excessive local electrical field stresses within small regions of the solid dielectric [1,2]. These defects can lead to a complete breakdown of the dielectric through the formation of tubular structures made up of gaseous channels of microscopic diameter, known as electrical trees, that spread across the material by a mechanism controlled, mainly, by partial discharges (PD) in the gaseous channels [3,4]
It is necessary to study the behavior of electrical trees in solid dielectrics in order to understand the phenomenon and predict the useful life times, or in other words, the time to breakdown [7]
Summary
Insulation systems are designed in such a way that the electric fields applied to the materials are lower than the inception values for breakdown mechanisms. Due to unforeseen manufacturing problems or operating conditions, metal contaminants, mechanical defects, conducting projections or air-filled cavities may appear, causing excessive local electrical field stresses within small regions of the solid dielectric [1,2]. These defects can lead to a complete breakdown of the dielectric through the formation of tubular structures made up of gaseous channels of microscopic diameter, known as electrical trees, that spread across the material by a mechanism controlled, mainly, by partial discharges (PD) in the gaseous channels [3,4]. It is necessary to study the behavior of electrical trees in solid dielectrics in order to understand the phenomenon and predict the useful life times, or in other words, the time to breakdown [7].
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
