Abstract
A microscopic theoretical model is proposed for calculating the characteristics of ultraviolet photoemission and x-ray secondary electron emission induced from CsI photoconverters. This approach is based on a realistic picture of the basic interactions of photons and induced electrons within the material. Both differential and integral emission characteristics, such as energy spectra and quantum efficiencies, are estimated according to the model and are found to agree, in general, with experimental data. The model-calculated photoemission enhancement under high external electric fields is also considered and is fairly compatible with measured values. The applicability of the model in the field of radiation detectors incorporating solid photoconverters is discussed.
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