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Abstract
A generalized optimal latching pulse for dynamic sense-amplifier design has been derived. The model equations account for threshold-voltage imbalance bit-line capacitance imbalance, current-gain imbalance, gate capacitance and intra-bit-line capacitive coupling effect, channel-length modulation, source-body effect, and temperature sensitivity in a unified manner. Computer simulations of the analytical equations, including those effects, are presented. The analytical results provide physical insight into sensing speed and the sensitivity of optimized waveforms in terms of process imbalances, device model parameters, and circuit design variables. A design implementation for fast sense-amplifier operation is also presented to demonstrate the utility of the model equations for practical application.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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