Abstract
An electron spectrometer has been attached to a Siemens Elmiskop I electron microscope in order to combine the facilities of microanalysis and conventional high magnification transmission electron microscopy of metals and alloys. Modifications have been made to the original design described by Cundy, Metherell and Whelan to improve both mechanical stability and microscope vacuum. The resolution of the equipment is 12 AA (Fresnel fringe), the specimen drift rate is 0.5 AA s-1 and the contamination rate of the specimen is less than 5 AA min-1. For typical exposure times the spatial resolution of the equipment is limited to about 100-200 AA by specimen drift.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
