Abstract
The effects of etch product layer on (a) the etch pit diameter and (b) the general etching velocity, V g, have been studied in a number of Solid State Nuclear Track Detectors. Observations were made under various etching conditions and attempts were made to reduce the adverse effects of the etched product layer. The results show that (a) the effect of the etch product formation is more serious in the case of oblique tracks (as compared with perpendicular or near perpendicular ones) and (b) the method of mechanical brushing of the detector surface during the etching process is quite effective in removing this layer.
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