An Image Catalogue of Micron- and Sub-micron-Sized Constrictions Fabricated with the Femtosecond Laser and Created with the AFM

Abstract

In this article a series of constrictions in the micron and sub-micron range fabricated with the femtosecond laser on superconducting {mathrm{YBa}}_{2}{mathrm{Cu}}_{3}{mathrm{O}}_{7} thin films is scanned with an atomic force microscope (AFM). The AFM images of the resulting constrictions are depicted. The width of the constrictions fabricated range from 1.24 µm micron dimension to 812 nm in the sub-micron range. The laser ablation spot size or diameter is set at 15.8 µm for the femtosecond laser and the separation distance between the centers of the laser ablation spots is varied between (16–17) µm as a result generating the variable constriction widths for the different superconductive bridges. The images of the fabricated micron and sub-micron constrictions are shown as a catalogue in the article. The AFM images give the surface morphology, dimensions, and physical continuity of the fabricated constriction qubits. The I–V characteristics of the constrictions are measured and validate the electrical continuity and superconductivity of the fabricated constrictions.