Abstract
A concept and preliminary design of an Extreme Ultraviolet (EUV) spectrometer is presented. The spectrometer is based on a gas ionization chamber and an advanced eight-electrode electron focusing system to form a narrow electron beam on a photodiode aperture. The design is modeled with the SIMulation of IONs (SIMION) tools and shows the ability to scan through the spectral range of 20.0 - 40.6 nm by changing the potential on a single control electrode between about 200 and 1100 V. The spectral resolution is about 0.25 nm in the middle of the band. The set of the focusing potentials may be changed to allow detection of solar EUV radiation in a wider spectral band, e.g. 5.0 - 50.0 nm. The potentials may be also optimized to improve the spectral resolution in a required spectral window.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
