Abstract
Three parameters—sample size, sampling intervals, and the control limits—must be determined when the x bar chart to monitor a manufacturing process. The constant sampling intervals were widely employed because of its administrative simplicity. However, the variable sampling interval (VSI) has recently been shown to give substantially faster detection of most process shifts than fixed-sampling-interval (FSI) for x-bar charts. In addition, these measurements in the subgroup are assumed to be normally distributed. That assumption may not be tenable. This investigation compares the economic design of x-bar control charts for non normal data under Weibull shock models with various sampling avenues.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
