Abstract
The single reflection echelon grating has the disadvantage that it is impossible to interpret the fringe pattern without further information about the correct order allocation. The present methods of obtaining this information are briefly reviewed; they are progressively less useful as the wavelength decreases into the ultra-violet. The properties of the grating are investigated theoretically when the light is incident at relatively large angles in two special cases, and the performance of the instrument in these positions compared with that of its normal use. It is shown that the required order allocation could be obtained using a single reflection echelon grating by measuring the fractional order separation with the grating in two positions. This would considerably increase the value of the instrument.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
