Abstract

Earlier study shows that resistor thickness of the thick film strain gauge can affect its temperature characteristic, which is usually a roughly parabolic curve. Thicker resistors tend to exhibit a higher positive temperature coefficient of resistance (TCR) and a lower T min , the temperature at which the TCR changes to zero in the curve. This paper presents a possible explanation of this observation based on an analysis of strain profiles and resistivity behaviour difference in resistors with different thicknesses subjected to temperature variation.

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