An experimental study on the degradation of the C12A7 hollow cathode

Abstract

Emitter overheating is by far the greatest problem limiting the performance of novel C12A7 hollow cathodes. To explore the failure operating point and degradation mechanism of the C12A7 hollow cathode, microscopic analyses of a degraded electride emitter after 10 h of thermal electron emission are presented in this paper. The morphology and composition variation of overheated electride emitters by scanning electron microscopy, energy-dispersive spectroscopy and X-ray diffraction indicate the melting and decomposition of electride of the surface layer. The monitored temperature of the electride emitter during the C12A7 hollow cathode operation shows that to avoid overheating the electride emitter, the average current density allowed should be about 64 mA mm−2 for the C12A7 hollow cathode in its current configuration. Experimental results of the heaterless C12A7 hollow cathode demonstrate that xenon (Xe) ion bombardment can remove the insulating layer and restore the thermionic emission capability for less degraded emitters. Based on experimental results and microscopic characterization, the depletion and degradation mechanisms of electride emitters during the hollow cathode operation are discussed.